No label defined (Q3139515)
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scientific article; zbMATH DE number 434680
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| English | No label defined |
scientific article; zbMATH DE number 434680 |
Statements
2 January 1994
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VLSI
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reconfiguration algorithms
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testing
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catastrophic fault patterns
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reference fault pattern
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0.8601804971694946
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0.8050025105476379
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0.7875804305076599
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