On reliability of circuits over the bases \(\{\sim,\&,\oplus\}\), \(\{\sim,\&,0\}\), \(\{\oplus, \&,1\}\), \(\{\oplus,\vee,1\}\) in the case of faults of type \(0\) at the outputs of elements (Q3225856)

From MaRDI portal

!

This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:

scientific article; zbMATH DE number 6018350
Language Label Description Also known as
default for all languages
No label defined
    English
    On reliability of circuits over the bases \(\{\sim,\&,\oplus\}\), \(\{\sim,\&,0\}\), \(\{\oplus, \&,1\}\), \(\{\oplus,\vee,1\}\) in the case of faults of type \(0\) at the outputs of elements
    scientific article; zbMATH DE number 6018350

      Statements

      On reliability of circuits over the bases {~, &, ⊕}, {~, &, 0}, {⊕, &, 1}, {⊕, ∨, 1} in the case of faults of type 0 at the outputs of elements (English)
      0 references
      0 references
      23 March 2012
      0 references
      reliability of circuits
      0 references
      unreliable elements
      0 references
      faults of type \(0\)
      0 references
      Boolean functions
      0 references

      Identifiers