Life distribution properties of devices subject to a pure jump damage process (Q3347068)
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scientific article; zbMATH DE number 3881626
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Life distribution properties of devices subject to a pure jump damage process |
scientific article; zbMATH DE number 3881626 |
Statements
Life distribution properties of devices subject to a pure jump damage process (English)
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1984
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random threshold
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optimal replacement
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survival distribution
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shock models
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0.8822335
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0.83561003
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0.8190697
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0.81237656
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0.8074573
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0.80574703
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