Toward the physical basis of complex systems: dielectric analysis of porous silicon nanochannels in the electrical double layer length range (Q3457331)
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scientific article; zbMATH DE number 6520970
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| English | Toward the physical basis of complex systems: dielectric analysis of porous silicon nanochannels in the electrical double layer length range |
scientific article; zbMATH DE number 6520970 |
Statements
14 December 2015
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dielectric analysis
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nanochannels
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electrical double layer
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ionic strength
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low-frequency permittivity
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0.6580321788787842
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0.6518667936325073
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0.651012659072876
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0.6475706100463867
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0.6473174691200256
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