Iddq testing-based diagnosis of faults in CMOS-circuits (Q378377)
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scientific article; zbMATH DE number 6225344
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| English | Iddq testing-based diagnosis of faults in CMOS-circuits |
scientific article; zbMATH DE number 6225344 |
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Iddq testing-based diagnosis of faults in CMOS-circuits (English)
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11 November 2013
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0.8004634976387024
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0.7805814743041992
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0.7768969535827637
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