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scientific article; zbMATH DE number 978920
| Language | Label | Description | Also known as |
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| default for all languages | No label defined |
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| English | No label defined |
scientific article; zbMATH DE number 978920 |
Statements
17 February 1997
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testing
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digital circuits
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test pattern
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VLSI
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0.6942756772041321
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0.6766846179962158
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