Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data (Q4369986)
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scientific article; zbMATH DE number 1104094
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| English | Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data |
scientific article; zbMATH DE number 1104094 |
Statements
8 May 2000
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bootstrap confidence interval
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likelihood ratio test
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random coefficients
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reliability
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standard-deviation function
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semiconductor degradation
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Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data (English)
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0.757095992565155
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0.7544758319854736
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