Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers (Q4419636)
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scientific article; zbMATH DE number 1964032
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| English | Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers |
scientific article; zbMATH DE number 1964032 |
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Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers (English)
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1995
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decompression
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multiple-polynomial LFSR
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scan design
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0.7935457825660706
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0.7386279702186584
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0.7374851703643799
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0.733619749546051
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0.727126955986023
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