Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method (Q443314)
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scientific article; zbMATH DE number 6063724
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| English | Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method |
scientific article; zbMATH DE number 6063724 |
Statements
Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method (English)
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7 August 2012
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atomic force microscopy
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electrostatic force microscopy
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boundary element method
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implicit differentiation method
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Maxwell stress tensor
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image charge method
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0.90866566
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0.88055384
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0.8690677
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0.8527806
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0.84845936
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0.8457732
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0.84281117
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