Wafer bin map recognition using a neural network approach (Q4468872)
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scientific article; zbMATH DE number 2073879
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Wafer bin map recognition using a neural network approach |
scientific article; zbMATH DE number 2073879 |
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Wafer bin map recognition using a neural network approach (English)
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11 June 2004
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defects
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0.764374315738678
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0.7381892800331116
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0.727064311504364
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0.7197796106338501
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