Capacity-constrained scheduling for a logic IC final test facility (Q4474709)
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scientific article; zbMATH DE number 2078829
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| default for all languages | No label defined |
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| English | Capacity-constrained scheduling for a logic IC final test facility |
scientific article; zbMATH DE number 2078829 |
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Capacity-constrained scheduling for a logic IC final test facility (English)
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12 July 2004
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0.7929661870002747
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0.764183759689331
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0.7606691122055054
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0.7551549673080444
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0.7533082962036133
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