Repetitive Testing in the Presence of Inspection Errors (Q4840425)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 777934
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Repetitive Testing in the Presence of Inspection Errors |
scientific article; zbMATH DE number 777934 |
Statements
14 September 1995
0 references
misclassification
0 references
nonconformances
0 references
semiconductor devices
0 references
retesting
0 references
expected benefit
0 references
Repetitive Testing in the Presence of Inspection Errors (English)
0 references
0.7878006100654602
0 references
0.7664082050323486
0 references
0.7546406984329224
0 references
0.7410687804222107
0 references
