An Accelerated Life Test Model Based on Reliability Kinetics (Q4842954)
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scientific article; zbMATH DE number 786470
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | An Accelerated Life Test Model Based on Reliability Kinetics |
scientific article; zbMATH DE number 786470 |
Statements
16 August 1995
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censored data
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ordinary differential equations
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life data analysis
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reliability
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accelerated life tests
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humidity-accelerated life test
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conductive anodic filament failures
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circuit boards
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chemical kinetic model
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likelihood-based methods
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An Accelerated Life Test Model Based on Reliability Kinetics (English)
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0.8270560503005981
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0.8249062299728394
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0.8246651291847229
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0.8075754642486572
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