Search boundaries of the truncated discrete sequential test (Q5123567)
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scientific article; zbMATH DE number 7252466
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Search boundaries of the truncated discrete sequential test |
scientific article; zbMATH DE number 7252466 |
Statements
Search boundaries of the truncated discrete sequential test (English)
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29 September 2020
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reliability
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test planning
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time between failures
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time to failure
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exponential distribution
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binomial distribution
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0.8740914
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0.86980784
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0.86024475
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0.85914886
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0.8588253
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0.8562064
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0.85603964
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0.8533805
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