Numerical algorithm and application in simulation of radiation damage effects on semiconductor devices (Q5143744)
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scientific article; zbMATH DE number 7295962
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|---|---|---|---|
| default for all languages | No label defined |
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| English | Numerical algorithm and application in simulation of radiation damage effects on semiconductor devices |
scientific article; zbMATH DE number 7295962 |
Statements
14 January 2021
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radiation effects
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ionizing effects
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total ionizing dose effect
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finite element method
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0.7980892062187195
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0.7333487272262573
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0.7109543085098267
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0.7078068852424622
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