Simultaneous Testing for the Successive Differences of Exponential Location Parameters (Q5481734)
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scientific article; zbMATH DE number 5045078
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| English | Simultaneous Testing for the Successive Differences of Exponential Location Parameters |
scientific article; zbMATH DE number 5045078 |
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Simultaneous Testing for the Successive Differences of Exponential Location Parameters (English)
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10 August 2006
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critical constants
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pairwise comparisons
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simultaneous confidence intervals
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tables
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0.8746137022972107
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0.8460528254508972
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0.8364108204841614
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0.8293951153755188
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