Optimum step‐stress accelerated life test plans for log‐location‐scale distributions (Q5503764)
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scientific article; zbMATH DE number 5493371
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| English | Optimum step‐stress accelerated life test plans for log‐location‐scale distributions |
scientific article; zbMATH DE number 5493371 |
Statements
Optimum step‐stress accelerated life test plans for log‐location‐scale distributions (English)
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16 January 2009
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cumulative exposure model
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large-sample approximate variance
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maximum likelihood
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0.91893053
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0.91891694
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0.9098641
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0.9061378
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