Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution (Q6073183)
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scientific article; zbMATH DE number 7750654
Language | Label | Description | Also known as |
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English | Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution |
scientific article; zbMATH DE number 7750654 |
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Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution (English)
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17 October 2023
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accelerated life tests
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density power divergence
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lognormal distribution
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one-shot devices
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robustness
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