fitPS (Q64379)
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Fit Probability Models to Forensic Survey Data
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | fitPS |
Fit Probability Models to Forensic Survey Data |
Statements
expanded from: GPL (≥ 2) (English)
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27 August 2026
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Fits probability models to P- and S-type count data arising from forensic surveys of clothing for the background presence of glass, paint, and related trace material. Built-in models include zeta, zero-inflated zeta, and logarithmic distributions, with a public extension interface for additional models. Inference is available by maximum likelihood, parametric Bayesian methods, the ordinary nonparametric bootstrap, and Rubin's Bayesian Bootstrap. The clothing-survey setting is described by Coulson, Buckleton, Gummer, and Triggs (2001) <doi:10.1016/S1355-0306(01)71847-3>.
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