Asymptotically optimally reliable circuits in the basis \(\{x_{1} \and x_{2} \and x_{3}, x_{1} \vee x_{2} \vee x_{3}, \overline {x}_{1}\}\) for inverse faults at the inputs of elements (Q650442)
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scientific article; zbMATH DE number 5980788
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| English | Asymptotically optimally reliable circuits in the basis \(\{x_{1} \and x_{2} \and x_{3}, x_{1} \vee x_{2} \vee x_{3}, \overline {x}_{1}\}\) for inverse faults at the inputs of elements |
scientific article; zbMATH DE number 5980788 |
Statements
Asymptotically optimally reliable circuits in the basis \(\{x_{1} \and x_{2} \and x_{3}, x_{1} \vee x_{2} \vee x_{3}, \overline {x}_{1}\}\) for inverse faults at the inputs of elements (English)
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25 November 2011
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optimally reliable circuit
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unreliable functional element
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inverse fault
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Boolean function
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AND gate
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OR gate
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voting function
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0.9593760371208192
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0.9213361740112304
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0.917664647102356
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0.911920726299286
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