Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system (Q833941)
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scientific article; zbMATH DE number 5595587
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| English | Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system |
scientific article; zbMATH DE number 5595587 |
Statements
Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system (English)
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14 August 2009
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epitaxial film/substrate system
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anisotropic elasticity
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channeling crack
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periodic array of channeling cracks
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critical condition for crack formation
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0.8647687435150146
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0.7370859384536743
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0.7125205397605896
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0.7104822397232056
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0.7095000743865967
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