Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations (Q869281)

From MaRDI portal





scientific article
Language Label Description Also known as
English
Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations
scientific article

    Statements

    Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations (English)
    0 references
    0 references
    2 March 2007
    0 references
    thin film
    0 references
    X-ray microdiffraction
    0 references
    non-local stress/curvature relations
    0 references

    Identifiers