The method of parallel-sequential built-in self-testing in integrated circuits of the type sFPGAs (Q885846)
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scientific article; zbMATH DE number 5164811
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| English | The method of parallel-sequential built-in self-testing in integrated circuits of the type sFPGAs |
scientific article; zbMATH DE number 5164811 |
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The method of parallel-sequential built-in self-testing in integrated circuits of the type sFPGAs (English)
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14 June 2007
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0.7144887447357178
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0.7021098136901855
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0.6952869296073914
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0.6927671432495117
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