Residual-based localization and quantification of peaks in X-ray diffractograms (Q958320)
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scientific article
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| English | Residual-based localization and quantification of peaks in X-ray diffractograms |
scientific article |
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Residual-based localization and quantification of peaks in X-ray diffractograms (English)
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3 December 2008
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nonparametric regression
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confidence regions
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peak detection
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X-ray diffractometry
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thin film physics
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0.706938624382019
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0.7069385051727295
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0.6968740820884705
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0.6716800332069397
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