MTBF of a complex binary coherent system

DOI10.1109/24.46452MaRDI QIDQ3033087zbMATH OpenOpenAlexFDO

Authors

Publication date 1989

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/24.46452

zbMATH Keywords

component failureincreasing failure rate distributionmean time between failuresminimal path setnew better than used distributionsystem failure

Mathematics Subject Classification ID

Applications of renewal theory (reliability, demand theory, etc.) (60K10) Reliability, availability, maintenance, inspection in operations research (90B25)

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Cited in

(2)

• Statistical properties and confidence limits about the mean time between the failures (MTBF) in failure-free period life test (FFPLT)
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