Measuring the intensity of knowledge flow with patent statistics

DOI10.1016/S0165-1765(01)00558-4MaRDI QIDQ5958529zbMATH OpenOpenAlexFDO

Authors Michael K. Fung, William W. Chow

Publication date 3 March 2002

Published in Economics Letters (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/s0165-1765(01)00558-4

zbMATH Keywords

innovationknowledge spilloverpatent

Mathematics Subject Classification ID

Statistical methods; economic indices and measures (91B82)

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• Measuring technological breadth and depth of patent documents using Rao’s Quadratic Entropy
• Knowledge spillovers in US patents: a dynamic patent intensity model with secret common innovation factors

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