On SPC for Short Run Autocorrelated Data

DOI10.1081/SAC-200047110MaRDI QIDQ4678900zbMATH OpenFDO

Authors Abdelmonem Snoussi, Mohamed El Ghourabi, Mohamed Limam

Publication date 23 May 2005

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1081/SAC-200047110

zbMATH Keywords

ARIMAarlautocorrelationcontrol chartlow volume dataq statisticstablestime series

Mathematics Subject Classification ID

Time series, auto-correlation, regression, etc. in statistics (GARCH) (62M10) Applications of statistics in engineering and industry; control charts (62P30)

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Cites work

• A review of statistical process control techniques for short run manufacturing systems
• A Statistical Control Chart for Stationary Process Data
• EVVMA and cusum control charts in the presence of correlation
• scientific article; zbMATH DE number 3649876 (Why is no real title available?)
• scientific article; zbMATH DE number 842531 (Why is no real title available?)
• Joint Estimation of Model Parameters and Outlier Effects in Time Series
• Run-Length Distributions of Special-Cause Control Charts for Correlated Processes

Cited in

(13)

• The quality control chart for monitoring multivariate autocorrelated processes
• On monitoring financial stress index with extreme value theory
• A review of statistical process control techniques for short run manufacturing systems
• Monitoring Variability and Analyzing Multivariate Autocorrelated Processes
• On the run length of a state-space control chart for multivariate autocorrelated data
• Statistical process control using run sums
• A Statistical Control Chart for Stationary Process Data
• Statistical process control for monitoring scheduling performance—addressing the problem of correlated data
• Average run lengths for cusum control charts applied to residuals
• Residual responses to change patterns of autocorrelated processes
• SPC for short-run multivariate autocorrelated processes
• Control charts for short runs
• Support vector regression based residual MCUSUM control chart for autocorrelated process

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