On dependent marking and thinning of point processes

DOI10.1016/0304-4149(93)90061-8MaRDI QIDQ1208957zbMATH OpenOpenAlexFDO

Authors Günter Last

Publication date 16 May 1993

Published in Stochastic Processes and their Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0304-4149(93)90061-8

zbMATH Keywords

stochastic orderingmarked point processcompensatorthinningsoftware reliabilityconditional mark distributions

Mathematics Subject Classification ID

Point processes (e.g., Poisson, Cox, Hawkes processes) (60G55)

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Cites work

• scientific article; zbMATH DE number 3223983 (Why is no real title available?)
• A Unification of Some Software Reliability Models
• Comparing Semi-Markov Processes
• Compensator conditions for stochastic ordering of point processes
• Ergodicity and inequalities in a class of point processes
• Markov chain models - rarity and exponentiality
• Monotone matrices and monotone Markov processes
• Monotonicity and comparability of time-homogeneous markov processes with discrete state space
• Multivariate point processes: predictable projection, Radon-Nikodym derivatives, representation of martingales
• On a simple proof of uniformization for continuous and discrete-state continuous-time Markov chains
• Optimal Thinning of a Point Process
• Point processes and queues. Martingale dynamics
• Statistical analysis of counting processes
• Stochastic inequalities on partially ordered spaces
• Stochastic ordering and thinning of point processes
• The Existence of Probability Measures with Given Marginals
• Weak convergence of probability measures and random functions in the function space D[0,∞)

Cited in

(6)

• scientific article; zbMATH DE number 3984243 (Why is no real title available?)
• Information-based thinning of point processes and its application to shock models
• Strong approximation of the number of renewal paced record times
• Coupling with compensators
• Gibbsianness and non-Gibbsianness for Bernoulli lattice fields under removal of isolated sites
• Detecting Dependence Between Marks and Locations of Marked Point Processes

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