On evaluating and optimizing weights for weighted random pattern testing
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Cited in
(10)- Provably good pattern generators for a random pattern test
- Weighted \(t\)-way sequences
- Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits
- Test-set partitioning for multi-weighted random LFSRs
- Antirandom test vectors for BIST in hardware/software systems
- On Random Pattern Test Length
- scientific article; zbMATH DE number 4029454 (Why is no real title available?)
- scientific article; zbMATH DE number 176529 (Why is no real title available?)
- Fault coverage and test length estimation for random pattern testing
- On the use of counters for reproducing deterministic test sets
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