On the second-order characteristics of marked point processes
Important data-analytical tools for investigating marked point processes are the second-order characteristics for the locations and the marks. Unnormed second-order characteristics are the mark variogram of Cressie and the mark covariance functions of Cressie and Stoyan. Normed second-order characteristics are Isham's mark correlation function and Soyan's \(k_{mm}\)-function. These definitions may lead to functions that are not well defined at the origin or to inconsistencies with definitions given in the random field context. Therefore, new definitions for the second-order characteristics of marked point processes are presented. Non reduced moment measures are involved in obtaining consistency with analogous definitions in the random field context. A certain \(\sigma\)-algebra replaces the current assumptions on stationarity and isotropy so that the characteristics are still well defined even if the assumptions do not hold.
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