Optimal static and dynamic recycling of defective binary devices

DOI10.1088/1742-5468/2004/11/P11003MaRDI QIDQ3160121zbMATH OpenOpenAlexFDO

Authors Isaac Pérez Castillo, Damien Challet

Publication date 1 February 2005

Published in Journal of Statistical Mechanics: Theory and Experiment (Search for Journal in Brave)

Full work available at URL https://arxiv.org/abs/cond-mat/0407664

zbMATH Keywords

message-passing algorithmsneuronal networks (theory)robust and stochastic optimizationstochastic search

Mathematics Subject Classification ID

Parallel numerical computation (65Y05) Learning and adaptive systems in artificial intelligence (68T05) Neural nets applied to problems in time-dependent statistical mechanics (82C32) Neural networks for/in biological studies, artificial life and related topics (92B20)

Abstract: The binary Defect Combination Problem consists in finding a fully working subset from a given ensemble of imperfect binary components. We determine the typical properties of the model using methods of statistical mechanics, in particular, the region in the parameter space where there is almost surely at least one fully-working subset. Dynamic recycling of a flux of imperfect binary components leads to zero wastage.

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