Parameterized study of the test cover problem
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Abstract: We carry out a systematic study of a natural covering problem, used for identification across several areas, in the realm of parameterized complexity. In the {sc Test Cover} problem we are given a set of items together with a collection, , of distinct subsets of these items called tests. We assume that is a test cover, i.e., for each pair of items there is a test in containing exactly one of these items. The objective is to find a minimum size subcollection of , which is still a test cover. The generic parameterized version of {sc Test Cover} is denoted by -{sc Test Cover}. Here, we are given and a positive integer parameter as input and the objective is to decide whether there is a test cover of size at most . We study four parameterizations for {sc Test Cover} and obtain the following: (a) -{sc Test Cover}, and -{sc Test Cover} are fixed-parameter tractable (FPT). (b) -{sc Test Cover} and -{sc Test Cover} are W[1]-hard. Thus, it is unlikely that these problems are FPT.
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- scientific article; zbMATH DE number 1947395 (Why is no real title available?)
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