Parameterized study of the test cover problem

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Abstract: We carry out a systematic study of a natural covering problem, used for identification across several areas, in the realm of parameterized complexity. In the {sc Test Cover} problem we are given a set [n]=1,...,n of items together with a collection, calT, of distinct subsets of these items called tests. We assume that calT is a test cover, i.e., for each pair of items there is a test in calT containing exactly one of these items. The objective is to find a minimum size subcollection of calT, which is still a test cover. The generic parameterized version of {sc Test Cover} is denoted by p(k,n,|calT|)-{sc Test Cover}. Here, we are given ([n],calT) and a positive integer parameter k as input and the objective is to decide whether there is a test cover of size at most p(k,n,|calT|). We study four parameterizations for {sc Test Cover} and obtain the following: (a) k-{sc Test Cover}, and (n−k)-{sc Test Cover} are fixed-parameter tractable (FPT). (b) (|calT|−k)-{sc Test Cover} and (logn+k)-{sc Test Cover} are W[1]-hard. Thus, it is unlikely that these problems are FPT.











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