Patterns in pattern recognition: 1968-1974

DOI10.1109/TIT.1974.1055306MaRDI QIDQ4773323zbMATH OpenFDO

Authors Laveen N. Kanal

Publication date 1974

Published in IEEE Transactions on Information Theory (Search for Journal in Brave)

Mathematics Subject Classification ID

Research exposition (monographs, survey articles) pertaining to computer science (68-02) Pattern recognition, speech recognition (68T10)

Cited in

(29)

• Cluster analysis by adaptive rank-order filters
• Additive estimators for probabilities of correct classification
• Feature definition in pattern recognition with small sample size
• Problems in pattern classification in high dimensional spaces: Behavior of a class of combined neuro-fuzzy classifiers
• Estimating the Posterior Probabilities Using the K-Nearest Neighbor Rule
• scientific article; zbMATH DE number 61461 (Why is no real title available?)
• Current and past roles of the statistician in space applications
• On the optimal number of features in the classification of multivariate Gaussian data
• A class of lower bounds on the Bayesian probability of error
• scientific article; zbMATH DE number 4092547 (Why is no real title available?)
• An algorithm for determining identity of nearest-neighbor and potential function decision rules
• Using a bicriteria Boolean linear programming model for parameter selection in large multicategory classification problem
• An efficient estimator of pattern recognition system error probability
• Classification and Discrimination Problems with Applications, Part IIa
• Generalized divergence measures and the probability of error
• Pattern recognition by means of disjoint principal components models
• On information and distance measures, error bounds, and feature selection
• Nonparametric iterative estimation of multivariate binary density
• Some aspects of error bounds in feature selection
• The use of context in pattern recognition
• Mahalanobis distance-based two new feature evaluation criteria
• Distance preserving linear feature selection
• Discrimination and classification: Overview
• A model for dimension reduction in pattern recognition using continuous data
• Linear feature selection with applications
• An application of formal linguistics to scene recognition
• Linear dimension reduction and Bayes classification
• An overtraining-resistant stochastic modeling method for pattern recognition
• Trigonometric entropies, Jensen difference divergence measures, and error bounds

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