Diego Zappa

Available identifiers

Publication	Date of Publication	Type
Non-parametric local capability indices for industrial planar manufacts: an application to the etching phase in the microelectronic industry	2024-07-29	Paper
Identification of spatial defects in semiconductor manufacturing	2024-07-25	Paper
Statistics for microelectronics	2024-07-10	Paper
Modeling General Practitioners’ Total Drug Costs through GAMLSS and Collective Risk Models	2023-02-10	Paper
Online detection of financial time series peaks and troughs: A probability‐based approach*	2020-10-14	Paper
Fitting financial returns distributions: a mixture normality approach	2018-12-13	Paper
Optimal reduction of a spatial monitoring grid: proposals and applications in process control	2017-06-30	Paper
Confidence Regions in Multivariate Calibration: A Proposal	2016-07-14	Paper
A novel approach to evaluate repeatability and reproducibility for ordinal data	2014-06-06	Paper
Confidence intervals for variance components in measurement system capability studies	2012-10-29	Paper
Misclassification rates, critical values and size of the design in measurement systems capability studies	2011-02-22	Paper
https://portal.mardi4nfdi.de/entity/Q4824091	2004-10-29	Paper

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