List of research outcomes
This list is not complete and representing at the moment only items from zbMATH Open and arXiv. We are working on additional sources - please check back here soon!
| Publication | Date of Publication | Type |
|---|---|---|
| Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories IEEE Transactions on Computers | 1980-01-01 | Paper |
Research outcomes over time
This page was built for person: Dong S. Suk
