Kyungmee O. Kim

Available identifiers

Publication	Date of Publication	Type
RELIABILITY COMPARISON OF TWO UNIT REDUNDANCY SYSTEMS UNDER THE LOAD REQUIREMENT	2022-11-18	Paper
Evaluating the failure risk with and without failure data	2022-04-14	Paper
Optimal number of components in a load-sharing system for maximizing reliability	2018-02-09	Paper
Multiscale representation for irregularly spaced data	2017-11-01	Paper
Effects of manufacturing defects on the device failure rate	2014-08-07	Paper
Bayesian reliability when system and subsystem failure data are obtained in the same time period	2014-08-06	Paper
Burn-in considering yield loss and reliability gain for integrated circuits	2012-05-14	Paper
Optimal burn-in for maximizing reliability of repairable non-series systems	2009-01-22	Paper
A unified model incorporating yield, burn-in, and reliability	2005-01-11	Paper
A general model of heterogeneous system lifetimes and conditions for system burn-in	2004-03-15	Paper

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