Constructing self-testing circuits with the use of step-by-step (cascade) control
From MaRDI portal
Publication:1040503
DOI10.1134/S0005117909070121zbMATH Open1181.93008MaRDI QIDQ1040503FDOQ1040503
Authors: B. B. Abramov, I. S. Levin, V. I. Ostrovskii, Osnat Keren
Publication date: 24 November 2009
Published in: Automation and Remote Control (Search for Journal in Brave)
Recommendations
- scientific article; zbMATH DE number 1216281
- Self-dual self-testing multicycle circuits: Their properties
- Detection of faults in combinational circuits by a self-dual test
- Self-diagnosis of digital systems containing units with self-checkable built-in testing circuits
- Synthesis and self-test of random logic control units
- Construction of code-disjoint self-parity combinational circuits for self-testing and functional diagnosis
- Design of easily testable combinational circuits
Hierarchical systems (93A13) Sampled-data control/observation systems (93C57) Fault detection; testing in circuits and networks (94C12)
Cites Work
Cited In (4)
This page was built for publication: Constructing self-testing circuits with the use of step-by-step (cascade) control
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q1040503)