A local limit theorem for a biased coin design for sequential tests
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Publication:1063370
DOI10.1214/AOS/1176349555zbMATH Open0574.62077OpenAlexW2008743064MaRDI QIDQ1063370FDOQ1063370
Authors: N. Heckman
Publication date: 1985
Published in: The Annals of Statistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1214/aos/1176349555
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