Curtailed and uniformly most powerful sequential tests
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Publication:1146963
DOI10.1214/aos/1176345149zbMath0448.62064MaRDI QIDQ1146963
B. K. Ghosh, Bennett Eisenberg
Publication date: 1980
Published in: The Annals of Statistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1214/aos/1176345149
likelihood ratio; exponential family; Neyman-Pearson lemma; curtailed tests; uniformly most powerful sequential tests; weakly admissible
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