Binary counter-based test generator in systems of compact testing

zbMATH Open0932.68004MaRDI QIDQ1287286FDOQ1287286

Authors: E. L. Stolov 

Publication date: 15 September 1999

Published in: Automation and Remote Control (Search for Journal in Brave)

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Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Cited In (3)

• A binary-counter exhaustive test generator for a class of finite-memory synchronous automata
• On the use of counters for reproducing deterministic test sets
• Computational analysis of counter-based schemes for VLSI test pattern generation

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