Binary counter-based test generator in systems of compact testing

MaRDI QIDQ1287286zbMATH OpenFDO

Authors E. L. Stolov

Publication date 15 September 1999

Published in Automation and Remote Control (Search for Journal in Brave)

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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Cited in

(3)

• A binary-counter exhaustive test generator for a class of finite-memory synchronous automata
• On the use of counters for reproducing deterministic test sets
• Computational analysis of counter-based schemes for VLSI test pattern generation

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