Thick points for transient symmetric stable processes

DOI10.1214/EJP.V4-47zbMATH Open0927.60077OpenAlexW2090935110MaRDI QIDQ1293640FDOQ1293640

Ofer Zeitouni, Amir Dembo, Yuval Peres, Jay Rosen

Publication date: 8 July 1999

Published in: Electronic Journal of Probability (Search for Journal in Brave)

Full work available at URL: https://eudml.org/doc/120048

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zbMATH Keywords

occupation measuremultifractal spectrumstable process

Mathematics Subject Classification ID

Local time and additive functionals (60J55)

Cited In (9)

• Thick points of the Gaussian free field
• Hausdorff dimension of the contours of symmetric additive Lévy processes
• Average densities of the image and zero set of stable processes
• Tightness for thick points in two dimensions
• Thick points for the Cauchy process
• Thick points for intersections of planar sample paths
• The fractal structures of the exceptional sets of Lévy processes
• Thick points for spatial Brownian motion: multifractal analysis of occupation measure.
• Thin points for Brownian motion

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