Thick points for transient symmetric stable processes

DOI10.1214/EJP.V4-47MaRDI QIDQ1293640zbMATHOpenAlexFDO

Authors Amir Dembo, Yuval Peres, Jay Rosen, Ofer Zeitouni

Publication date 8 July 1999

Published in Electronic Journal of Probability (Search for Journal in Brave)

Full work available at URL https://eudml.org/doc/120048

zbMATH Keywords

occupation measuremultifractal spectrumstable process

Mathematics Subject Classification ID

Local time and additive functionals (60J55)

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Cited in

(10)

• Average densities of the image and zero set of stable processes
• Thin points for Brownian motion
• Hausdorff dimension of the contours of symmetric additive Lévy processes
• Thick points for spatial Brownian motion: multifractal analysis of occupation measure.
• The fractal structures of the exceptional sets of Lévy processes
• Thick points of two independent stable subordinators
• Thick points for the Cauchy process
• Tightness for thick points in two dimensions
• Thick points for intersections of planar sample paths
• Thick points of the Gaussian free field

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