Planning accelerated life tests for selecting the most reliable product
DOI10.1016/0378-3758(94)90165-1zbMath0798.62099OpenAlexW1993582451WikidataQ127857786 ScholiaQ127857786MaRDI QIDQ1333105
Publication date: 13 September 1994
Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/0378-3758(94)90165-1
tablessample sizeWeibull distributionoptimum test plansnumber of failurestype-I censoringaccelerated life testselection rulecensoring timehighly reliable productscost criterionminimum probability of correct selectionasymptotic variance of estimated quantilescensoring plansexpected life-testing timeoptimal ALT sampling plantype- II censoringWeibull-log-linear life-stress model
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- Multiple statistical decision theory: recent developments
- Optimal Accelerated Life Designs for Estimation
- Selecting, under type-II censoring, Weibull populations that are more reliable
- Planning accelerated life tests with type II censored data
- Bayesian estimation and optimal designs in partially accelerated life testing
- Accelerated Testing
- Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
- Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability
- Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions
- A Bayesian Model for Determining the Optimal Test Stress for a Single Test Unit
- Selecting the most reliable design under type-II censored accelerated testing
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