A new characterization of the Gamma distribution and associated goodness-of-fit tests

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Publication:138399

DOI10.1007/S00184-019-00708-7zbMATH Open1432.62028arXiv1806.06028OpenAlexW3102306777MaRDI QIDQ138399FDOQ138399


Authors: Steffen Betsch, Bruno Ebner, Steffen Betsch, Bruno Ebner Edit this on Wikidata


Publication date: 29 January 2019

Published in: Metrika (Search for Journal in Brave)

Abstract: We propose a class of weighted L2-type tests of fit to the Gamma distribution. Our novel procedure is based on a fixed point property of a new transformation connected to a Steinian characterization of the family of Gamma distributions. We derive the weak limits of the statistic under the null hypothesis and under contiguous alternatives. Further, we establish the global consistency of the tests and apply a parametric bootstrap technique in a Monte Carlo simulation study to show the competitiveness to existing procedures.


Full work available at URL: https://arxiv.org/abs/1806.06028




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