A Bayesian semiparametric regression model for reliability data using effective age

DOI10.1016/j.csda.2013.11.015zbMath1506.62108WikidataQ57963081 ScholiaQ57963081MaRDI QIDQ1623436

Timothy E. Hanson, Li Li

Publication date: 23 November 2018

Published in: Computational Statistics and Data Analysis (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.csda.2013.11.015

zbMATH Keywords

truncated data; repairable system; effective age; tailfree process

Mathematics Subject Classification ID

62-08: Computational methods for problems pertaining to statistics

62G08: Nonparametric regression and quantile regression

62G05: Nonparametric estimation

62F15: Bayesian inference

62N05: Reliability and life testing