NBTI-aware transient fault rate analysis method for logic circuit based on probability voltage transfer characteristics
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Publication:1736761
DOI10.3390/a9010009zbMath1461.94107OpenAlexW2292424272MaRDI QIDQ1736761
Xiyuan Peng, Yang Yu, Jun-Bao Li, Zhi-Ming Yang
Publication date: 26 March 2019
Published in: Algorithms (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.3390/a9010009
VLSI circuitaging effectsdiscrete probability density function approximationtransient faultvoltage transfer characteristics
Fault detection; testing in circuits and networks (94C12) Switching theory, applications of Boolean algebras to circuits and networks (94C11)
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