Goodness-of-fit tests for complete spatial randomness based on Minkowski functionals of binary images
DOI10.1214/18-EJS1467zbMATH Open1404.62045OpenAlexW2963558585WikidataQ129221943 ScholiaQ129221943MaRDI QIDQ1786579FDOQ1786579
Authors: Bruno Ebner, Norbert Henze, Michael Andreas Klatt, Klaus Mecke
Publication date: 24 September 2018
Published in: Electronic Journal of Statistics (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1710.02333
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Cited In (8)
- Lipschitz-Killing curvatures of excursion sets for two-dimensional random fields
- Global envelope tests for spatial processes
- Testing goodness of fit for point processes via topological data analysis
- Spatial extremes and stochastic geometry for Gaussian-based peaks-over-threshold processes
- Testing the complete spatial randomness by Diggle's test without an arbitrary upper limit
- Testing multivariate uniformity based on random geometric graphs
- Testing marginal symmetry of digital noise images through the perimeter of excursion sets
- Characterization of anisotropic Gaussian random fields by Minkowski tensors
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