Accounting for persistence in panel count data models. An application to the number of patents awarded
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Publication:1788032
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Cites work
- Estimating the dimension of a model
- Individual effects and dynamics in count data models.
- Inference in Semiparametric Dynamic Models for Binary Longitudinal Data
- Marginal Likelihood From the Metropolis–Hastings Output
- Marginal Likelihood from the Gibbs Output
- Market Share, Market Value and Innovation in a Panel of British Manufacturing Firms
- Markov Regression Models for Time Series: A Quasi-Likelihood Approach
- Posterior simulation and Bayes factors in panel count data models
- Regression analysis of count data
- The Calculation of Posterior Distributions by Data Augmentation
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