Stochastic degradation process modeling and remaining useful life estimation with flexible random-effects

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Publication:1796621

DOI10.1016/J.JFRANKLIN.2016.06.039zbMath1398.93318OpenAlexW2473198494MaRDI QIDQ1796621

Jianfei Zheng, Zhengxin Zhang, Chang-Hua Hu, Xiao-Sheng Si, Jian-Xun Zhang

Publication date: 17 October 2018

Published in: Journal of the Franklin Institute (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.jfranklin.2016.06.039




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