KPI relevant and irrelevant fault monitoring with neighborhood component analysis and two-level PLS

DOI10.1016/J.JFRANKLIN.2018.07.016zbMATH Open1398.93364OpenAlexW2890457970MaRDI QIDQ1796752FDOQ1796752

Authors: Ting Lan, Chudong Tong, Xiaoxia Chen, Xuhua Shi, Yu-Wei Chen 

Publication date: 17 October 2018

Published in: Journal of the Franklin Institute (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.jfranklin.2018.07.016

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zbMATH Keywords

fault monitoringkey performance indicatortwo-level partial least square modeling

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Least squares and related methods for stochastic control systems (93E24)

Cites Work

• Fault detection and diagnosis in industrial systems
• Direct projection to latent variable space for fault detection
• Assessment of \(T^2\)- and \(Q\)-statistics for detecting additive and multiplicative faults in multivariate statistical process monitoring
• A novel dynamic non-Gaussian approach for quality-related fault diagnosis with application to the hot strip mill process

Cited In (5)

• Robust PLS approach for KPI-related prediction and diagnosis against outliers and missing data
• A new data-driven process monitoring scheme for key performance indictors with application to hot strip mill process
• A key performance indicator‐relevant approach based on kernel entropy component regression model for industrial system
• Canonical correlation analysis-based explicit relation discovery for statistical process monitoring
• Improved key performance indicator-partial least squares method for nonlinear process fault detection based on just-in-time learning

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