Instability of a compressed elastic film on a viscous layer
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Publication:1858682
DOI10.1016/S0020-7683(02)00011-2zbMATH Open1051.74580OpenAlexW2128234082MaRDI QIDQ1858682FDOQ1858682
Authors: Yanyan Li
Publication date: 17 February 2003
Published in: International Journal of Solids and Structures (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/s0020-7683(02)00011-2
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Cited In (23)
- Simulations of autonomous fluid pulses between active elastic walls using the 1D-IRBFN method
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- Kinetic wrinkling of an elastic film on a viscoelastic substrate
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- An unconditionally energy stable scheme for simulating wrinkling phenomena of elastic thin films on a compliant substrate
- Viscous flow beneath a viscous or plastic skin
- Crack-front instability in a confined elastic film
- Swelling and instability of a gel annulus
- Elastic-plated gravity currents
- Capillary levelling of immiscible bilayer films
- Wrinkling of a charged elastic film on a viscous layer
- Dynamic stability of flexible electronic structures under step loads
- Buckling analysis and buckling control of thin films on shape memory polymer substrate
- Dynamic stability of a thin film bonded to a compliant substrate subjected to a step load with damping
- Wrinkle patterns of anisotropic crystal films on viscoelastic substrates
- Material compressibility effects for the squeeze of very thin films
- A nonlinear electromechanical model for partially debonded thin-sheet piezoelectric actuators
- Finite width effect of thin-films buckling on compliant substrate: experimental and theoretical studies
- Buckling of a stiff thin film on a compliant substrate in large deformation
- Wrinkling in graded core/shell systems using symplectic formulation
- Variational formulation, asymptotic analysis, and finite element simulation of wrinkling phenomena in modified plate equations modeling biofilms growing on agar substrates
- Compression of a hyperelastic layer-substrate structure: transitions between buckling and surface modes
- A displacement-based approach to geometric instabilities of a film on a substrate
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